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MetaPULSE-IIIa System

Achieve high throughput and low cost-of-ownership for film thickness measurements in aluminum applications
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WaferWoRx 300 System

Scrub mark analysis for sort process control and yield improvement
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Harmony ASR Software

A fast, intuitive, off-line, all-surface review and classification solution
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06/10/2008

IEEE SW Test Workshop

San Diego, CA
05/08/2008

Rudolph Technologies Receives Multiple System Order for AXi 940 Inspection Modules

Strong early orders affirm value of new tool in production environment
05/05/2008

Rudolph Technologies Announces First Quarter Revenue Sequentially Increased 14% Exceeding Guidance

04/15/2008

Rudolph Announces Installation of Multiple NSX Tools at WIN Semiconductors’ GaAs Foundry

NSX System provides the throughput and defect sensitivity needed for a cost-effective inspection solution