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MetaPULSE-G System

Delivers superior performance on Cu films that are critical in advanced device technologies and new TSV processes
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PrecisionWoRx VX4 System

Efficient probe card test, analysis, and rework for fine pitch, small array probe cards
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Harmony ASR Software

A fast, intuitive, off-line, all-surface review and classification solution
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05/05/2010

SNEC PV Power Expo 2010

Shanghai, China
05/11/2010

Taiwan Yield Forum 2010

Hsinchu, Taiwan
02/16/2010

Rudolph Technologies Receives $5 Million in Capacity Orders for Metrology Production Tools from Tier One Memory Manufacturer

Stability and tool-to-tool matching key factors in selection of Rudolph’s S3000A transparent metrology systems for gate oxide dielectric process
02/01/2010

Rudolph Technologies Fourth Quarter 2009 Financial Results Exceed Guidance; Record Bookings Lay Foundation For Robust 2010