Rudolph Technologies provides process characterization solutions and applications support for semiconductor manufacturers around the world. The company's product portfolio for wafer processing customers includes high-performance metrology systems for opaque and transparent film measurement, sophisticated yield management software on a fabwide scale and automated macro defect inspection systems that can identify and analyze defects on all surfaces of a silicon wafer. Products and technologies developed primarily for final manufacture and test include software products for defect analysis and review, high-speed macro defect inspection systems and probe card test and analysis solutions. With a strong history beginning in 1940, our strategy for continued technological and market leadership includes aggressive research and development, and dedicated applications support on a global scale.

Rudolph is a public company, listed on the NASDAQ National Market as RTEC. It is headquartered in Flanders, NJ. The company is comprised of three main lines of business: The Metrology Business Unit, located in Budd Lake, NJ; The Inspection Business Unit, located in Bloomington, MN; and The Data Analysis and Review Business Unit located in Lowell, MA. In addition, an extensive global network of sales, service, and applications offices are located in Texas, Europe, Korea, Taiwan, Japan, Singapore, and China.