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MetaPULSE-IIIa System
Achieve high throughput and low cost-of-ownership for film thickness measurements in aluminum applications
ProbeWoRx 300 System
High speed, high force, and high throughput for high pin-count, large array probe cards
Process Sentinel Software
Monitor your process 24/7, and trace surface patterns to inline process issues
05/05/2010
SNEC PV Power Expo 2010
Shanghai, China
05/11/2010
Taiwan Yield Forum 2010
Hsinchu, Taiwan
03/15/2010
Rudolph Technologies Selects Distribution Partner for Probe Card Test and Analysis Products in Europe
New distributor, John P. Kummer, enhances sales and support for probe analysis products in critical European markets
02/16/2010
Rudolph Technologies Receives $5 Million in Capacity Orders for Metrology Production Tools from Tier One Memory Manufacturer
Stability and tool-to-tool matching key factors in selection of Rudolph’s S3000A transparent metrology systems for gate oxide dielectric process
02/01/2010
Rudolph Technologies Fourth Quarter 2009 Financial Results Exceed Guidance; Record Bookings Lay Foundation For Robust 2010