Home   |   News and Events   |   2008 News Archive
2008 News Archive

Rudolph Reports Fourth Quarter Results Below Guidance and Announces Impairment and Write-down Charges

12/19/2008

Rudolph NSX Selected for Inspection and Metrology of New Through-Silicon Via Process

12/02/2008

Rudolph’s New Explorer Macro Defect Inspection System Gains Traction with Low Cost-of-Ownership

12/02/2008

Rudolph Technologies Announces Third Quarter Revenue Increased with Earnings Exceeding Guidance

10/30/2008

Notice of Conference Call for Rudolph Technologies

10/03/2008

Rudolph Announces Appointment of New Board Member, Leo Berlinghieri

09/22/2008

Rudolph Releases New Wafer Edge and Backside Macro Inspection Modules

09/08/2008

Rudolph Technologies Announces Orders for WaferWoRx 300 Probing Process Analysis Systems

09/03/2008

Rudolph Technologies Announces Second Quarter Revenue Sequentially Increased Exceeding Guidance

08/04/2008

Rudolph Technologies, Inc. Wins Summary Judgement Ruling Against Camtek, Ltd.

07/15/2008

Rudolph’s Next-Generation PrecisionWoRx VX4 Extends the Capabilities of Leading Probe Card Test and Analysis Tool

07/15/2008

Rudolph Technologies Announces Sale of Lead Scanner Assets to BKM Technology Partners

07/14/2008

Rudolph Technologies Second Quarter Revenue to Exceed Guidance, Sequential Revenue Growth Forecast for the Third Quarter

07/09/2008

Rudolph Technologies Receives Follow-on Order from Micronas for NSX Macro Defect Inspection System

06/30/2008

Rudolph Technologies to Host Analyst Meeting at Semicon West

06/16/2008

Rudolph Receives Multiple System Orders from Data Storage Manufacturer

05/28/2008

Rudolph Announces New Wafer Scanner 3840 System for Post-Fab Inspection and 3D Bump Metrology

05/15/2008

Rudolph Technologies Receives Multiple System Order for AXi 940 Inspection Modules

05/08/2008

Rudolph Technologies Announces First Quarter Revenue Sequentially Increased 14% Exceeding Guidance

05/05/2008

Rudolph Technologies Schedules 2008 First Quarter Earnings Conference Call for May 5, 2008

04/18/2008

Rudolph Announces Installation of Multiple NSX Tools at WIN Semiconductors’ GaAs Foundry

04/15/2008

Rudolph Ships MetaPULSE-III to Asia Memory Fab for Copper Interconnect Metrology

03/06/2008

Rudolph Joins Leading Chipmakers in SEMATECH’s Metrology Program at UAlbany NanoCollege

02/20/2008

Rudolph Technologies Announces Fourth Quarter and 2007 Year End Results

02/07/2008

Rudolph Technologies Launches High-Productivity AXi 940 Inspection Module

01/29/2008

Rudolph Announces Intellectual Property and Asset Purchase from RVSI Inspection

01/22/2008

Rudolph Technologies Schedules 2007 Fourth Quarter and Full Year Earnings Conference Call for February 7, 2008

01/17/2008

Rudolph Technologies to Present at the 10th Annual Needham Growth Stock Conference

01/03/2008