FLANDERS, NJ (January 3, 2008) -- Rudolph Technologies, Inc. (NASDAQ: RTEC), a worldwide leader in high-performance process characterization systems for the semiconductor manufacturing industry, today announced that Paul McLaughlin, Chairman and Chief Executive Officer, will present at the 10th Annual Needham Growth Stock Conference to be held at the New York Palace Hotel in New York City, N.Y. on Wednesday, January 9, 2008 at 3:00pm EST. A simultaneous webcast of the presentation will be provided and can be accessed at the company's web site, http://www.rudolphtech.com.

Who: Paul McLaughlin, Chairman and CEO
When: Wednesday, January 9, 2008; 3:00pm EST
Where: The New York Palace Hotel, New York City, N.Y.

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Rudolph Technologies is a worldwide leader in the design, development, manufacture and support of high-performance process control metrology, defect inspection and data analysis systems used by semiconductor device manufacturers. Rudolph provides a full-fab solution through its families of proprietary products that provide critical yield-enhancing information, enabling microelectronic device manufacturers to drive down costs and time to market. The company has enhanced the competitiveness of its products in the marketplace by anticipating and addressing many emerging trends driving the semiconductor industry's growth. Rudolph's strategy for continued technological and market leadership includes aggressive research and development of complementary metrology and inspection solutions. Headquartered in Flanders, New Jersey, Rudolph supports its customers with a worldwide sales and service organization. Additional information can be found on the company's web site at www.rudolphtech.com.

For more information, please contact:

Rudolph Technologies:
Stephanie A. Spivack
973.448.4306