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Home   |   Products   |   Outgoing Quality Control
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Outgoing Quality Control

Outgoing QC is final assurance of wafer quality using visual inspection, to find defects which may be a leading indicator of wafer unreliability.

AXi 940 Module

B30 Module

E30 Module

E30+B30 Module

Explorer Inspection Cluster

MetaPULSE-IIIa System

NSX Series

Advanced Macro Defect Inspection
Post-Fab Die and Wafer Inspection
Test Floor Inspection
European Fab Installs Second Rudolph Inspection System to Meet 100-Percent Inspection Requirements of Automotive Industry
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