ChipScale Review, October 2008

Probe mark analysis (PMA) provides a critical link between the data collected by probe card analyzers (PCA) and the actual performance of the probe card in the test cell. Systematic discrepancies between probe card test data and actual on-wafer performance can be corrected to improve visibility of the probing process. Real-time feedback on probe performance enables knowledge-based maintenance and repair, eliminating unnecessary downtime and yield losses associated with fixed interval or run-to-fail maintenance methodologies.

-Darren James, Product Manager

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