Nearly every major device manufacturer uses Rudolph Technologies' systems to improve product quality, manufacturing productivity and time to market -- increasingly important considerations in the competitive and evolving microelectronics manufacturing environment. Our commitment to invest in research and development has resulted in bringing the best possible metrology and inspection solutions to the industry. New products incorporate industry-leading cost of ownership benefits, and are designed to support advanced manufacturing processes at 65 nm and 45 nm nodes, with a development roadmap that currently extends to the 32 nm node.